DF 745 G MAX_2
DF高纯

针对特种气体应用而优化的DF-745 SGMax水分分析仪

DF-745 SGMax是一款基于可调谐激光二极管(TDL)传感器的微量级水分分析仪,设计用于测量特种气体混合应用中的各种气体混合物。

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面向特种气体混合应用的灵活解决方案

Joseph Ha
Joseph Ha
纯度与专业产品经理

DF-745 SGMax采用智能集成软件,包括一个涵盖17种标准背景气体(包括最多八种气体的混合物)的数据库,可以提供灵活的解决方案,满足多种应用需求。通过前面板可以直接预设三十种定制气体混合物。

坚固耐用的SGMax便于携带,几乎不需要此类应用中常见的干燥时间。TDL技术可以提供百万分之0-100 (ppm) 的宽测量范围,低检测限 (LDL) 为十亿分之5 (ppb) – 这是不使用泵的前提下能够达到的低水平。超稳定的零漂移传感技术有助于延长标定周期并减少后续维护需求。

Gas Cylinders With Pressure Gauge In A Specialized Laboratory Laboratory

靈活的TDL痕量測量,適用於多種混合氣體

當您需要分析純淨和特種氣體混合應用中作為污染物的水分時,您需要具有低LDL和寬量程的高精度,穩定測量。堅固的設計允許攜帶乾燥時間,這對過程效率至關重要,記錄生產的要求也是如此

Korean Service centre 2

絕不妥協的解決方案

SGMax的核心是功能強大的應用程序軟件,專門設計用於混合包含單一氣體和混合物的特種氣體以及最多八種成分。現在,擴展後的數據庫包含17種標準背景氣體,包括CF4,C2F6,C3F8,C4F8和NF3,而用戶可以為常規混合物預定義氣體混合物模板,或使用前控制面板定義自定義混合物。可以使用簡單的數據收集程序添加自定義氣體。SGMax幾乎還消除了乾燥時間,這歸功於巧妙的硬件/軟件設計和緊湊,重量輕的格式,從而確保了應用程序所需的簡化的端口到端口的移動性。

Member of Service team walking to analyzer

維護簡單,降低了運行成本

經過工廠校準,Servomex的高穩定性TDL傳感技術所提供的零漂移性能無需正在進行的校準,而無損耗傳感器技術則無需更換。出色的5ppb LDL是最低的測量水平,無需額外的設置成本和使用泵的持續費用.SGMax經過優化,可實現快速有效的運行,具有純淨和特種氣體混合物的存儲和召回功能,可更大程度地減少停機時間之間的切換氣缸尺寸。這些優勢使SGMax成為您可以依賴的適應性強的高性能分析儀。

Servomex System components

为您提供专业的气体分析仪方案

如果您需要构造一套气体分析系统,仕富梅专家随时可以提供帮助。请与我们联系,我们会通过密切协作为您提供合适的分析系统,满足您的应用需求。

TDL水分测量的优势

DF-745 SGMax针对特种气体应用而设计,可以提供超稳定的水分监测性能并大幅节约成本

Versatile-op-web-size-a

集成LCD界面

气体混合物的存储、调取和测量数据都可以显示在DF-745 SGMax的内置LCD屏幕上。

Excellent Measurement

灵活的测量

DF-745 SGMax具有0-100ppm的宽检测范围和低至5ppb的低检测限LDL。

Maintain red

维护周期更长

超稳定TDL传感器意味着DF-745 SGMax无需频繁维护,而且维护简单,不需要耗材。

非凡的性能
使用業界先进的高穩定性TDL跟踪和零漂移超跟踪
分析不受氣室污染的影響。 SGMax能夠以高達90%的信號損耗達到規範要求


靈活
痕量可調諧二極管激光器(TDL)感測通過與光學元件的最少水分接觸提供了高穩定性測量
廣泛的檢測範圍:0-100ppm
通過集成的LCD接口顯示氣體混合物的存儲,調用和測量數據


易於使用
純/特種氣體混合混合物:包含17種標準背景氣體和多達8種氣體的混合物的數據庫。預定義30種氣體混合物模板或創建自定義混合物
顯示屏顯示實時分析和參考光譜,以提高用戶信心
在集成的LCD界面上顯示數據或下載到USB驅動器
輕巧緊湊在端口之間輕鬆移動,非常適合其他移動應用
通過內部USB連接最多可以下載3個月的數據歷史記錄。


擁有成本低
通過使用獲得專利的超穩定,零漂移,無損耗的TDL傳感技術,可以延長維護週期
零漂移可降低校準要求5ppb
实现低LDL,無需泵


基準合規
IEC 61010-1
II類過電壓,污染等級2
歐盟EMC指令
歐盟低壓指令

DF-745 SGMax将TDL传感技术与耐用的Herriot Cell测量池相结合,可以在宽测量范围内实现微量级和超微量级水分监测。

加油站 测量
水蒸气(水分) (H₂O)ppm, ppb

Technologies

DF-745 SGMax trace moisture analyzer

證書

IEC 61010-1
II類過電壓,污染等級2
歐盟EMC指令
歐盟低壓指令

原理图(选择展开)

尺寸

19 inch (48.3cm) Wide x 10.5 inch (26.7 cm) High x 22.5 inch (57.2 cm) Deep

重量

70磅(31.8公斤)

获取详细规格

“要获得深入的规范,您将需要下载我们的技术数据表,其中包括有关技术,性能,操作环境,样品条件和合规性的信息,以及技术图纸和顶级收益和应用。”

Joseph Ha
Joseph Ha
纯度与专业产品经理

DF-745 SGMax资源包已准备好下载

“确保您拥有有关DF-745 SGMax的所有信息。我们已将所有重要资源收集到一个简单的下载中。现在就获取它,以确保您充分了解情况。”

Joseph Ha
Joseph Ha
纯度与专业产品经理

手册和手册

了解DF-745 SGMax的所有功能,优势和技术规格–立即下载操作手册和产品手册。

SERVOPRO DF-700 Gen 7 推荐备件

适用于DF-700系列分析仪的备件清单

SERVOPRO DF-700 Gen 7 推荐备件

适用于DF-700系列分析仪的备件清单

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DF-745 SGMax NanoTrace操作手册

专为特殊气体应用设计的水分分析仪综合指南

DF-745 SGMax NanoTrace操作手册

专为特殊气体应用设计的水分分析仪综合指南

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SERVOPRO DF-745 SGMax 产品手册

测量特种气体配气应用中的各种气体混合物

SERVOPRO DF-745 SGMax 产品手册

测量特种气体配气应用中的各种气体混合物

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SERVOPRO DF-700 Gen 6 推荐备件

适用于DF-700系列分析仪的备件清单

SERVOPRO DF-700 Gen 6 推荐备件

适用于DF-700系列分析仪的备件清单

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典型应用

DF-745 SGMax针对特殊气体中的水分测量进行了优化,并提供了适用于各种应用需求的适应性解决方案。

特种气瓶质量控制检查|散装气瓶质量控制

超高压气体/半导体

全面的系统解决方案

在我们正在进行的播客系列的最新一集中,了解您需要了解的关于我们著名的 SERVOPRO 水分气体分析仪系列 Gen-7 的所有信息。

Transcript

Gen-7 Podcast transcript

DB: My name is Douglas Barth. I’m the USTC product manager for the DF-700, and I’m here today with…

PR: I’m Phil Rogers, and I am the senior applications engineer here at the USTC for Servomex.

DB: We are going to introduce you to the Generation Seven NanoTrace DF-700 analyzer. It’s a modern analyzer. It’s been recently re-engineered, redesigned…

PR: Re-engineered, updated.

DB: …For the modern LCD and LED manufacturing processes that require ultra-trace quality measurement for moisture, contaminants, and ultra-high-purity electronic grade gases. In such a demanding application, users need analysis capable of delivering high accuracy and low, ultra-low detection limits in multiple background gases. No matter how demanding the application requirement, you will want a device that reduces preventative maintenance costs, maximizes uptime and has a long life in the marketplace.

We don’t believe you should have to compromise, and that’s one of the reasons why we are so bullish on the DF-700 product. So, given that the previous generation is going to end its production run, Phil, can you tell some of the listeners why this new project has been undertaken?

PR: Oh, sure. The DF-700 has been around in its current iteration for about 20 years. That’s quite a long run with the same basic architecture. The circuit board designs are all old, very complicated wiring. It’s essentially an analog analyzer because, you know, the signal gets digitized at the end and… running out of suppliers for a lot of these old components, so we had to update the electronics and the processing power of the analyzer to something that’s current, that will be serviceable for years to come, and get us ready for the next 20 years.

DB: So this is a completely digital analyzer?

PR: Yes, it is, in fact, completely digital.

DB: Wow. Excellent. Yeah, I heard a lot about digitization in the industrial gas side of the business. Great to see that digitization is coming to the semiconductor side of those Servomex products. This new Generation Seven DF-700, how’s it better positioned for our customers in the future?

PR: I wouldn’t say so much that is better positioned, but certainly positioned well in a modern platform. The signal processing means that what we have at our disposal now with the digital instrument is much greater. This allows us to get a quieter signal out of the analyzer which will result in improved detection limits, response time, and elimination of events that are not moisture or oxygen-related. And so that in itself should make a huge difference to our end-users, especially those in the CQC world, the semiconductor manufacturers that are keeping these things running 24-7, 365.

DB: So you’re telling me that all-new electronics, new PCB, hard drive, operating system… so everything is contemporary within the analyzer for this new digital platform? Have you updated the laser cell?

PR: The laser cell itself is essentially unchanged. Herriott cell design doesn’t, you know… you can’t really improve on that. It’s a simple design that’s robust and durable. And so, we are using the exact same cell, exact same lasers, the exact same mirrors. But what we’re doing is we’re getting the signal out of there in a different fashion.

DB: That’s awesome. So I can understand now how this digital platform with all these new pieces are coming together to improve the operation of the instrument. What will the actual customers see on their side of the analyzer from all these new additions that are made in this redesign?

PR: You know, from the outside, the analyzer looks essentially the same. The screen is much bigger, and much brighter, so it’s easier to read and more information can be displayed on the screen in a clear and understandable way. You can see what the analyzer is telling you from across the room, as opposed to having to put your readers on and get in front of the analyzer.

If the unit requires service, the experience will be much better. The sensors, and all components, can be swapped in situ really by a competent field service engineer or technically savvy end-user. Everything is right there, easy to get to, calibration will be following the moisture cell instead of being on the hard drive, the calibrations are on the moisture cell, or if you get a 760, the calibrations are on the oxygen cell, so all of these things make a much smoother service experience. If or when the inevitable service call comes in, it should be easy to do and make the customer happy.

DB: I know that some of the complaints for the previous generation have been about field serviceability. With all these new components, have you designed in some features that will allow the instrument to be serviced in the field?

PR: You know, everything is accessible, from the power supplies that provide power for the CPU and the moisture sensor, to the boards that contain the relays, analog outputs and serial communications. The solid-state hard drive is right there, easy to access, as is the CPU. Again, getting down to the sensors themselves, if something happens and the unit requires service, a new sensor or sensor swap, for troubleshooting purposes even, which does happen, it’s just a matter of pulling it and putting the sensor into the analyzer. The analyzer will pull the circuit board for that sensor, get all the calibration off of it and you’re up and running. Right? Just like that.

DB: So it’s the hard drive, the CPU, the PCBs, the display, the gas panel, all of those items now can be serviced in the field?

PR: Yes.

DB: Wow. That’s a big step forward. That’s the meat of the components within the analyzer that service engineers usually touch. That’s fantastic. You mentioned that the Herriott cell has been around for quite a long time. How long has it been around and could you tell us a little bit about the Herriott cell?

PR: Yeah, the Herriott cell is old technology that was invented in 1965 by the aptly named Donald Herriott. And it consists of two spherical mirrors, with an aperture in one of them, that allows the light from the laser to enter and exit the Herriott cell. It gives you a very long path length, up to 93 passes, which is about a 50-meter path length. So that’s essentially what a Herriott cell is, spherical mirrors with the light from the laser bouncing back and forth between them.

DB: So I know that the Herriott cell is where the actual sample or measurement is taken. Specifically, Servomex uses Tunable Diode Laser Absorption Spectroscopy inside that Herriott cell. Tell the listeners a little bit about the benefits and features of Tunable Diode Laser.

PR: The Tunable Diode Laser is a neat technology, but we’re looking at it as an absorption spectrometer. So we have to know the wavelength at which moisture absorbs light. And in this case we use 1854 nanometers where you get the laser output tuned to that output frequency by adjusting the temperature on the laser. Each laser has its own unique characteristics and so the laser temperature is unique for each laser.

And once we get the moisture peak tuned in, we modulate the current to that laser, which essentially causes that output to scan across the moisture peak. The moisture peaks at 1854. So we go from, say 1853 and a half to 1854 and a half, and one nanometer, by modulating the current to that laser and slightly affecting the output frequency of that laser.

So, you’re scanning across the moisture peak literally thousands of times a second, and you’re getting a lot of information out of there. It is a direct reading spectrometer. It will compare with the CRDS technology, which is also widely used in the semiconductor industry. CRDS is Cavity Ring-Down Spectroscopy, and what that does, is that emits a pulse of light within the sample cell. It goes between two highly reflective mirror surfaces and they measure the decay time, essentially, for that light to completely decay beyond detectable limits. And that sounds all well and good, but, you know, you’re measuring time, you’re not measuring moisture. And if those mirrors become fogged, or lose any of the reflectivity, it’s going to greatly impact the sensitivity of the device, and the detection limit of the device.

DB: That’s quite a difference. I mean, the only thing that’s basically the same between those two is the laser. They’re very different after that light enters into the chamber.

PR: They use a different frequency than we do as well. They use 1392 nanometers as opposed to ours, which is 1854. But that’s a minor difference there, really.

DB: You mentioned that we used the 1854 wavelength for our measurement. I picked up on something you said about being able to know the centroid of that 1854 wavelength. Could you tell the listeners a little bit more about that?

PR: Okay. Well, what we do is we have what we call a reference peak that the analyzer utilizes to keep the laser tuned properly. Our sensor is divided into two sections. We’ve got the Herriott cell, which is where the sample gas is, and the lasers, and then we have the laser chamber itself, which is isolated from the Herriott cell, and is hermetically sealed and pressurized deep out to keep out contamination.

And we separate the laser chamber from the Herriott cell with a little sapphire window. There’s a small amount of light that reflects off of that window, probably close to, you know, 1% or even less of the light from the laser, is reflected off that window back through. We have a little cuvette out there that contains moisture, so that reflective laser passes through that cuvette to a separate detector. Now there’s always moisture in there, and so the reference detector always shows a moisture peak. The software of the analyzer is designed to recognize that peak and if it sees that peak moving a little bit one way or the other, up or down in wavelength, it will adjust the current being supplied to that laser just a little bit to ensure that the peak stays in the right location and thus the laser is tuned to the proper output frequency.

DB: So if I understand this right, Phil, you’re saying that we use a secondary detector and a cuvette of moisture, and bleed off a little bit of the laser, constantly tell the analyzer where the moisture peak is, and make sure that it doesn’t deviate from that wavelength.

PR: That’s correct.

DB: Another piece that I heard you say during your explanation of Tunable Diode Laser Absorption Spectroscopy was this moisture peak sweep operation. How does that benefit our customers, that the analyzer and our laser technology sweeps across the entire peak?

PR: The sweeping across the peak, there’s a lot going on there. As you sweep across the peak, you’re measuring the brightness of the laser both on-peak and off-peak as you scan across that wavelength. The nature of this measurement is ratiometric. So unlike the cavity ring down, which you discussed earlier, if we lose a little bit of reflectivity due to optical fogging or who knows what real-life sort of things might happen to an instrument in an industrial application, you lose a little bit of reflectivity.

It’s not a big deal at all to analyze to compensate for that automatically, because the light will decrease, the intensity of light will decrease, both on-peak and off-peak, by the same percentage. So the ratio at any given moisture concentration between the on-peak measurement and the off-peak measurement is going to be the same at any given moisture concentration.

So if you lose 10% of your reflectivity – that’s both on-peak and off-peak – and if the ratio between the on-peak and off-peak measurement is going to stay the same, the measurement accuracy is going to stay the same. We had some years ago, we had an analyzer that lost more than 90% of its reflectivity due to contamination. We fired that up in our lab and tested against our known standards and it was still reading accurately with a greater than 90% reflectivity. I have to say I was surprised when that happened, but it gave me faith in the product.

DB: Wow, a 90% loss in an actual intensity of the laser and still measuring accurately, that’s amazing.

PR: It was astonishing to me, quite honestly. There it was. It worked.

DB: So sweeping across the peak, if you lose reflectivity or intensity, you could lose intensity from either the detector and its ability to pick it up, or the laser source. Would not this also calibrate out differences in the laser source and detector?

PR: Anything that has to do with the intensity of the light, be it the output of the laser degrading over the years, the output characteristics of the detector degrading over the years, or the reflectivity of the mirrors being affected by process conditions, all of this, from an algorithmic standpoint, it doesn’t matter to the algorithm.

DB: Say there was an interfering gas in with the background gas and you went off-peak, and it did absorb the laser, that interfering gas would be attenuated and you could calibrate that out?

PR: Yes, it would just be offset out anyways. You’re looking at the center peak, you’re not looking at anything off to the side. And moisture is rather specific at 1854, so in general, interfering elements are pretty much just offset out of there.

DB: So interfering elements, a difference in the intensity of the laser source, a difference in the ability to detect that source, and any kind of contamination on the mirror is instantaneously tenuously zeroed out of the analyzer for you and corrected for?

PR: Yeah.

DB: That’s amazing. No wonder this technology’s been around so long and is used in so many different places like ultra-high purity, semiconductor applications, specialty gas, the electronics market, LED, and display manufacturing.

Thank you so much for taking your time today, Phil, and discussing the amazing capabilities of Tunable Diode Laser and the new Gen-7 DF-700 product. I’d like to thank you for your time.

PR: You’re entirely welcome. This has been a fun thing to do.

DB: And I would like to remind all our listeners to visit servomex.com and find out more about the Gen-7 analyzer online. Thank you.

 


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